Iwona Malinowska


doktor 
adiunkt 
5384119 
probabilistyka, statystyka matematyczna 
zastosowania wartości rekordowych i;uogólnionych statystyk porządkowych w zagadnieniach statystycznych i charakteryzacyjnych 
www 

MATERIAŁY NA ZAJĘCIA

 

 


 

 

 

 

SPIS PUBLIKACJI


  • I. Mali­now­ska, K. W. Mor­ris,  D. Szy­nal, On dual cha­rac­te­ri­za­tions of con­ti­nu­ous distri­bu­tions in terms of expec­ted values of two func­tions of order sta­ti­stics and record values, J. Math. Sci. 121, (2004), 2664–2673.
  • I. Mali­now­ska and D.  Szy­nal, On a family of Bay­esian esti­ma­tors and pre­dic­tors for Gum­bel model based on the k-th lower records, Appl. Math. 31(1), (2004), 107–115.
  • I. Mali­now­ska and D. Szy­nal, Infe­rence and pre­dic­tion for the Burr type X model based on the k-th lower record, J. Sta­tit. Theor. and Appl. 4(3), (2005), 282–291.
  • I. Mali­now­ska, P. Paw­las, D. Szy­nal, Esti­ma­tion of the para­me­ters of Gum­bel and Burr distri­bu­tions in terms of k-th record values, Appl. Math. 32, (2005), 375–393.
  • I. Mali­now­ska, P. Paw­las, D. Szy­nal, Esti­ma­tion of loca­tion and scale para­me­ters for Burr XII distri­bu­tions using gene­ra­li­zed order sta­ti­stics, Linear Alge­bra and Its Appl. 417, (2006), 150 –163.
  • I. Mali­now­ska and D. Szy­nal, On cha­rac­te­ri­za­tion of cer­tain distri­bu­tions of k-th lower (upper) record values, Appl Math.Comput. (2008),  338–347
  • I. Mali­now­ska, and D. Szy­nal, Infe­rence and pre­dic­tion for a logi­stics distri­bu­tion based on the k-TH lower records, Jour­nal of Applied Sta­ti­sti­cal Science, 17(1), (2009), 107–120.
  • I. Mali­now­ska, and D. Szy­nal, Rela­tions for cha­rac­te­ri­stics func­tions of k-th record values from gene­ra­li­zed Pareto and inverse gene­ra­li­zed Pareto distri­bu­tion, Applic­tio­nes Mathe­ma­ti­cae 36 (2), (2009), 157–168.
  • I. Mali­now­ska, and D. Szy­nal, Infe­rence and pre­dic­tion for a gene­ra­li­zed expo­nen­tial distri­bu­tion based on the k-TH lower records, Inter­na­tio­nal Jour­nal of Pure and Applied Mathe­ma­tics,  52(2), (2009),  211–227.